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Researchers have recently introduced a groundbreaking technique that allows for the measurement of permittivity in insulators with exceptional precision, surpassing previous methods by a factor of 100. This advancement is expected to significantly contribute to the development of highly sensitive radio receivers for radio telescopes, as well as the advancement of devices for the next generation of communication networks, known as “Beyond 5G/6G.”

Permittivity is an essential value that signifies how electrons within an insulator react when subjected to an applied voltage. It serves as a crucial parameter in understanding the behavior of radio waves as they travel through insulators. Accurate determination of permittivity is necessary in the development of telecommunications equipment, such as circuit boards and building materials, as well as in the field of radio astronomy for components used in radio receivers.

The research team, consisting of scientists and engineers from the National Astronomical Observatory of Japan (NAOJ) and the National Institute of Information and Communications Technology (NICT), devised a calculation method for electromagnetic wave propagation. Through this, they developed an analytical algorithm that allows for the direct derivation of permittivity, eliminating the need for approximations. The team successfully utilized this new method to measure the lens material for a receiver being developed for the Atacama Large Millimeter/submillimeter Array (ALMA), achieving consistent results and demonstrating its effectiveness in practical device development.

Reducing the margin of error by a factor of 100 significantly accelerates the development process. Accurate measurement of permittivity is critical to meet target performance requirements and optimize fabrication processes. By knowing the permittivity accurately from the design stage, unnecessary trial and error can be reduced, leading to cost savings.

Traditionally, several methods have been employed for permittivity measurement. One accurate technique is the “resonance method,” which necessitates the placement of the material to be measured in a resonator. However, this method requires precise processing of the material, sometimes with thicknesses of only a few hundred micrometers. Additionally, permittivity can only be measured at specific frequencies, impeding the development process by necessitating meticulous processing for each measurement.

On the other hand, the “free-space method” offers fewer limitations and drawbacks. However, accurate measurement becomes challenging due to an approximation used for analyzing the measurement results, introducing errors. The newly developed analysis method overcomes these issues and is used in conjunction with the “free-space method,” enabling accurate permittivity measurement with fewer constraints.

NAOJ and NICT have been collaboratively working on researching and developing high-precision material property measurement systems for millimeter-wave and terahertz-wave frequencies. By merging the knowledge gained from astronomical instrument development and communication technology advancement, the team aims to achieve further technological innovations in the field.

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